MTDT 2009 - Call for Papers

Submission Deadline Extended to May 3rd, 2009!

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

Following the traditions set up by its predecessors, MTDT09 will provide a forum dedicated to the recent advancements of the memory technology, covering topics such as memory device, circuit design, architecture, fabrication process, verification, yield analysis testing/diagnosis/repair for all kinds of memory such as SRAM, DRAM, Flash memory, EPROM, EEPROM, embedded memories, 3-D memories, content addressable memories, etc.

Original contributions related to memory design and test technology are solicited. Topics of interest include, but are not limited to, the following categories:

Next-generation memory device
Next-generation memory process
Low-voltage memory circuit design
3D memories
Volatile memory devices
Non-volatile memory devices
High-speed memory circuit design
Low-power memory circuit design
Fault-tolerant architecture
Memory compiler
Memory testing
Memory built-in self-test
Memory diagnosis & repair
Cell Characterization
Failure analysis
Fault modeling
Yield analysis
Reliability analysis
Memory for space application
Verification methodology
Design and test for SSD

Submissions

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Web page: http://nthucad.cs.nthu.edu.tw/~mtdt09/
Submission deadline: extended to May 3rd, 2009

If you encounter problem in submitting the paper via web page, please send your manuscript and information to the Program Chair, Chih-Tsun Huang, via email cthuang@cs.nthu.edu.tw.

Key Dates

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Submission deadline: extended to May 3, 2009
Notification of acceptance:May 22, 2009
Final copy deadline: June 8, 2009

Committees

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ORGANIZING COMMITTEE

General Co-Chairs
Cheng-Wen Wu, National Tsing Hua U., Taiwan
Rochit Rajsuman, San Jose State-U, USA

Program Chair
Chih-Tsun Huang, National Tsing Hua U., Taiwan

Finance Chair
Meng-Fan Chang, National Tsing Hua U., Taiwan

Local Arrangements Chair
Jen-Chieh Yeh, SOC Technology Center, ITRI, Taiwan

Publications Chair
Jin-Fu Li, National Central U., Taiwan

Registration Chair
Shyue-Kung Lu, Fu-Len Catholic U., Taiwan

PROGRAM COMMITTEE

For the list of the Program Committee members see http://nthucad.cs.nthu.edu.tw/~mtdt09/

For more information, visit us on the web at: http://nthucad.cs.nthu.edu.tw/~mtdt09/

The IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2009) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).